Cellix provides high accurate and count defensible evidence of use to help clients to win the patent litigations or negotiations.
Finding prior art to support patent infringement disputes.
Estimating the reference valuation of target patents.
Quickly select patents and products matching relationships from a large number of patents and products at a low cost.
Process analysis services include surface analysis, cross-section analysis and material analysis.
Process analysis can be used as a method of obtaining evidence of use in process/structral patent infringement litigation.It can also be used as an important detection method for IC failure analysis.
Circuit extraction and analysis can provide valuable evidence of use that can not be found by other methods for patent dispute.Moreover, the new market entrants can use it for ramping up learning curve and staying abreast of the competition for established market players.
Decap the chip and move the metal and dielectric layer, then capture images layer by layer, joint and align the images. Finally, create an image database.
Base on the image database, recognize the digital cell, analog devices and the connection between them. Finally, get a flat netlist or schematic.
Base on the self-developed EDA tools Hierux System and BoolSmart System, combined with datasheet, analyze and organze the flat schematic into the hierarchical schematic.